Interferometric cross check of two recommended wavelength standards at 633 nm and 657 nm

CPEM Digest (Conference on Precision Electromagnetic Measurements)

Volumn , Issue , 1996, Pages 195-196

  Boensch, G ^a   Nicolaus, A ^a   Darnedde, H ^a   Riehle, F ^a   Trebst, T ^a   Zinner, G ^a  

^a PHYSIKALISCH TECHNISCHE BUNDESANSTALT   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CALCIUM; FREQUENCY STABILITY; HELIUM NEON LASERS; INTERFEROMETERS; INTERFEROMETRY; LIGHT INTERFERENCE; LIGHT POLARIZATION; SPECTRUM ANALYSIS;

FARADAY ROTATING OPTICAL ISOLATOR; INTERFEROMETRIC CROSS CHECK; MICHELSON INTERFEROMETERS; OPTICAL PATH DIFFERENCE; WAVELENGTH STANDARDS;

FREQUENCY STANDARDS;

EID: 0029745508     PISSN: 05891485     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (3)