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Volumn , Issue , 1996, Pages 261-263
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Fabrication of large-scale x-ray multilayers by DECR plasma sputtering
a a a a |
Author keywords
[No Author keywords available]
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Indexed keywords
AUGER ELECTRON SPECTROSCOPY;
CARRIER CONCENTRATION;
ELECTRON CYCLOTRON RESONANCE;
ELLIPSOMETRY;
FABRICATION;
MICROWAVE GENERATION;
PLASMAS;
SPUTTERING;
SYNCHROTRON RADIATION;
TRANSMISSION ELECTRON MICROSCOPY;
X RAY DIFFRACTION ANALYSIS;
DISTRIBUTED ELECTRON CYCLOTRON RESONANCE;
ENERGY DISPERSIVE MASS SPECTROMETRY;
IN SITU DISPERSIVE X RAY REFLECTOMETRY;
LANGMUIR PROBE;
LARGE SCALE X RAY MULTILAYERS;
MULTILAYER DEPOSITION SYSTEM;
MULTIPOLAR MAGNETIC PLASMA CONFINEMENT;
PLASMA SPUTTERING;
X RAY MEASUREMENTS;
MULTILAYERS;
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EID: 0029737158
PISSN: 12660167
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (2)
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References (5)
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