Morphology of lamellar C70 single crystals as studied by atomic force microscopy

Japanese Journal of Applied Physics, Part 2: Letters

Volumn 35, Issue 1 A, 1996, Pages

  Jiang, Lei ^a   Iyoda, Tomokazu ^a   Kino, Nobuhiro ^a   Kitazawa, Koichi ^a   Hashimoto, Kazuhito ^a   Fujishima, Akira ^a  

^a UNIVERSITY OF TOKYO   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CRYSTAL GROWTH; CRYSTAL STRUCTURE; MOLECULAR ORIENTATION; MORPHOLOGY; SINGLE CRYSTALS; SURFACES; VAPOR PHASE EPITAXY; X RAY CRYSTALLOGRAPHY;

HEXAGONAL CLOSED PACKED; LAMELLAR SINGLE CRYSTALS; MONOLAYER SPREADING GROWTH MECHANISM; SURFACE MOLECULAR DISORDER;

FULLERENES;

EID: 0029736465     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.35.l48     Document Type: Article

References (13)