High-quality surface measurements using the Gabor expansion

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 2651, Issue , 1996, Pages 117-125

  Friedmann, Michael ^a   Kotzer, T ^a   Shamir, Joseph ^a  

^a TECHNION ISRAEL INSTITUTE OF TECHNOLOGY   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

GABOR EXPANSION; OPTICAL INSPECTION; SLIDING WINDOW SPECTRA; ZAK TRANSFORM;

ALGORITHMS; COMPUTER SIMULATION; DIFFRACTION; INSPECTION; LIGHT SCATTERING; MATHEMATICAL MODELS; MATHEMATICAL TRANSFORMATIONS; OPTICAL PROPERTIES; SIGNAL PROCESSING; SURFACE PROPERTIES;

LIQUID CRYSTAL DISPLAYS;

EID: 0029736296     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (12)