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Volumn , Issue , 1996, Pages 5-10
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On the road to building-in reliability
a a a |
Author keywords
[No Author keywords available]
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Indexed keywords
ELECTRONIC EQUIPMENT MANUFACTURE;
ELECTRONIC EQUIPMENT TESTING;
RELIABILITY;
RISK ASSESSMENT;
BUILDING IN RELIABILITY (BIR);
TESTING IN RELIABILITY (TIR);
ELECTRONIC EQUIPMENT;
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EID: 0029736193
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (3)
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References (1)
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