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Volumn 153, Issue 1, 1996, Pages 299-304

Electron beam induced current studies on a photoconductor made of partially compensated GaAs

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CHARGE; ELECTRIC CONTACTS; INDUCED CURRENTS; MESFET DEVICES; PHOTOCONDUCTING DEVICES; SEMICONDUCTING GALLIUM ARSENIDE;

EID: 0029735359     PISSN: 00318965     EISSN: None     Source Type: Journal    
DOI: 10.1002/pssa.2211530131     Document Type: Article
Times cited : (2)

References (10)
  • 9
    • 0041317845 scopus 로고
    • 8, in: Quantitative Scanning Electron Microscopy
    • 9 D. B. Holt, in: Quantitative Scanning Electron Microscopy, Chap. 8, Ed. M. Muir et al, Academic Press, London 1974.
    • (1974)
    • Holt, D.B.1
  • 10
    • 85120509203 scopus 로고
    • Proc. 17th Annual Semicond. Conf. (CAS)
    • 10 F. Riesz and L. Ryc, Proc. 17th Annual Semicond. Conf. (CAS), Oct. 11 to 16, 1994, Sinaia (Romania), Res. Inst. for Electronic Components, Bucharest 1994 (p. 179).
    • (1994) , pp. 179
    • Riesz, F.1    Ryc, L.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.