SCOPUS 정보 검색 플랫폼

Optics and Lasers in Engineering

Volumn 24, Issue 2-3, 1996, Pages 183-213

Deformation mapping and surface inspection of historical monuments

(5) Gulker G a Helmers, H a Hinsch, K D a Meinlschmidt, P a Wolff, K a

a UNIVERSITY OF OLDENBURG (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CORRELATION METHODS; CRACKS; DEFORMATION; IMAGE PROCESSING; IMAGING SYSTEMS; INSPECTION; SPECKLE; STRUCTURAL LOADS; STRUCTURES (BUILT OBJECTS);

COMMON PATH CONFIGURATIONS; DOUBLE EXPOSURE SPECKLE PHOTOGRAPHY; ELECTRONIC SPECKLE PATTERN INTERFEROMETRY; HISTORICAL MONUMENTS; ON THE SITE MEASUREMENTS; OPTICAL HEAD; PORTABLE IMAGE PROCESSING EQUIPMENT;

HOLOGRAPHIC INTERFEROMETRY;

EID: 0029735266 PISSN: 01438166 EISSN: None Source Type: Journal
DOI: 10.1016/0143-8166(95)00022-4 Document Type: Article

Times cited : (24)

References (21)

1
- 0043035893
- Laboratorio de Engenharia Civil, Lisbon
- (1992) Proc. 7th Int. Congr. Deterioration and Conservation of Stone , pp. 937-946
- Rodriguez, J.D.¹ Henriques, F.² Jeremias, F.T.³

2
- 0002893908
- Holography in the conservation of statuary
- (1973) Studies in Conservation , vol.18 , pp. 49-63
- Asmus, J.F.¹ Guattari, G.² Lazzarini, L.³ Musumeci, G.⁴ Wuerker, R.F.⁵

3
- 0016102258
- Holographic methods for painting diagnostics
- (1974) Appl. Opt. , vol.13 , pp. 2009-2013
- Amadesi, S.¹ Gori, F.² Guattari, G.³ Grella, R.⁴

4
- 0021132428
- Double exposure specklehologram for strain measurements in fresco diagnostics
- (1984) Opt. Commun. , vol.48 , pp. 309-312
- Paoletti, D.¹ D'Altorio, A.² Amadesi, S.³

5
- 0025464768
- Electronic speckle pattern interferometry system for in situ deformation monitoring on buildings
- (1990) Optical Engineering , vol.29 , pp. 816-820
- Gülker, G.¹ Hinsch, K.² Hölscher, C³ Kramer, A.⁴ Neunaber, H.⁵

6
- 84975603085
- Fiber optic phase stepping system for interferometry
- (1991) Applied Optics , vol.30 , pp. 729-734
- Mercer, C.R.¹ Beheim, G.²

7
- 0041798423
- Phase-measuring fiber optic electronic speckle pattern interferometer: phase step calibration and phase drift minimization
- (1992) Optical Engineering , vol.31 , pp. 315-321
- Joenathan, C.¹ Khorana, B.²

8
- 0020133918
- Shearography: new optical method for strain measurement and nondestructive testing
- (1982) Opt. Engng , vol.21 , pp. 391-395
- Hung, Y.Y.¹

9
- 84975594179
- Digital speckle pattern shearing interferometrylimitations and prospects
- (1991) Applied Optics , vol.30 , pp. 2730-2738
- Owner-Petersen, M.¹

10
- 0027687242
- Artwork diagnostics with fiber-optic digital speckle pattern interferometry
- (1993) Appl. Opt. , vol.32 , pp. 6236-6240
- Paoletti, D.¹ Spagnolo, G.S.² Facchini, M.³ Zanetta, P.⁴

11
- 85110893160
- Automated digital speckle pattern interferometry contouring in artwork surface inspection
- (1993) Optical Engineering , vol.32 , pp. 1348-1353
- Paoletti, D.¹ Spagnolo, G.²

12
- 0003928204
- Cambridge University Press
- (1983) Holographic and Speckle Interferometry
- Jones, R.¹ Wykes, C.²

13
- 0001143882
- Recent developments in video speckle interferometry
- R.S. Sirohi, Marcel Dekker, New York
- (1993) Speckle Metrology , pp. 157-194
- Løkberg, O.J.¹

14
- 24444450871
- Electronic speckle pattern interferometry for 3-D dynamic deformation analysis in industrial environments
- R. Ahlers, T. Tschudi, Proc. SPIE 1500
- (1991) Innovative Optics and Phase Conjugate Optics , pp. 124-134
- Gülker, G.¹ Haack, O.² Hinsch, K.³ Hölscher, C.⁴ Kuls, J.⁵ Platen, W.⁶

15
- 4243943543
- Automatic timing of ESPI fringe storage in long-term measurements based on speckle correlation formalism
- W. Jüptner, W. Osten, Akademie Verlag, Berlin
- (1993) Fringe '93 , pp. 411-416
- Gülker, G.¹ Helmers, H.² Hinsch, K.D.³ Hölscher, C.⁴

16
- 0038595780
- Two-wavelength electronic speckle-pattern interferometry for the analysis of discontinuous deformation fields
- (1992) Applied Optics , vol.31 , pp. 4519-4521
- Gülker, G.¹ Haack, O.² Hinsch, K.D.³ Hölscher, C.⁴ Kuls, J.⁵ Platen, W.⁶

17
- 0023999467
- Phase measuring real time holographic interferometry with a tunable laser diode
- (1988) Opt. Commun. , vol.66 , pp. 74-78
- Ishii, Y.¹

18
- 0004027147
- Wiley, New York
- (1979) Holographic Interferometry
- Vest, G.M.¹

19
- 0001816034
- Speckle methods in experimental mechanics
- R.S. Sirohi, Marcel Dekker, New York
- (1993) Speckle Metrology , pp. 99-155
- Sirohi, R.S.¹

20
- 84975582360
- Parallel optical evaluation of double exposure records in optical metrology
- (1989) Applied Optics , vol.28 , pp. 726-729
- Arnold, W.¹ Hinsch, K.²

21
- 0010145467
- Detection of surface microstructure changes by electronic speckle pattern interferometry
- Y.N. Denisyuk, F. Wyrowski, Proc. SPIE 1732
- (1993) Holographics International '92 , pp. 492-501
- Gülker, G.¹ Hinsch, K.² Hölscher, C.³

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.