Deterministic test pattern reproduction by a counter

Proceedings of European Design and Test Conference

Volumn , Issue , 1996, Pages 37-41

  Kagaris, Dimitrios ^a   Tragoudas, Spyros ^a   Majumdar, Amitava ^a  

^a SOUTHERN ILLINOIS UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; COMPUTER AIDED DESIGN; DESIGN AIDS; MATRIX ALGEBRA; VECTORS;

BINARY COUNTER; BUILT IN SELF TEST (BIST); DESIGN FOR TESTABILITY; DETERMINISTIC TEST PATTERN GENERATION;

COUNTING CIRCUITS;

EID: 0029734955     PISSN: 10661409     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (23)