High resolution transmission electron microscopy study of quasi-amorphous MoSx coatings

Surface and Coatings Technology

Volumn 78, Issue 1-3, 1996, Pages 19-25

  Grosseau Poussard, J L ^a   Garem, H ^a   Moine, P ^b  

^a UNIVERSITÉ DE POITIERS   (France)

^b UNIVERSITÉ DE LA ROCHELLE   (France)

Author keywords

Deformation microstructures; High resolution TEM; MoS2; Solid lubrication; Sputter deposition

Indexed keywords

AMORPHOUS MATERIALS; ION BEAMS; MICROSTRUCTURE; MOLYBDENUM COMPOUNDS; SILICON; SOLID LUBRICANTS; SPUTTER DEPOSITION; STEEL; SUBSTRATES; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY; TRIBOLOGY;

AMORPHOUS STRUCTURE; DEFORMATION MICROSTRUCTURE; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; ION BEAM ASSISTED FILM; ION BEAM SPUTTERING; KAUFMAN ION SOURCE; TRIBOLOGICAL PROPERTIES;

COATINGS;

EID: 0029734912     PISSN: 02578972     EISSN: None     Source Type: Journal    
DOI: 10.1016/0257-8972(94)02389-1     Document Type: Article

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