Effect of electric current on duration of cleavage luminescence

Applied Physics Letters

Volumn 68, Issue 3, 1996, Pages 385-387

  Busch, E ^a   Haneman, D ^a   McAlpine, N S ^a  

^a UNIVERSITY OF NEW SOUTH WALES   (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

BOND RUPTURE; CARRIER RECOMBINATION; CLEAVAGE LUMINESCENCE; PIEZORESISTANCE EFFECT;

CRACKS; CURRENT DENSITY; EFFECTS; ELECTRIC CURRENTS; ELECTRIC RESISTANCE; LUMINESCENCE; NUMERICAL METHODS; PIEZOELECTRICITY; SURFACES; VACUUM;

SILICON WAFERS;

EID: 0029734864     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.116693     Document Type: Article

References (12)

1. D. Haneman and N. McAlpine, Phys. Rev. Lett. AIP 66, 758 (1991).
2. D. G. Li, N. S. McAlpine, and D. Haneman, Surf. Sci. Lett. 281, 315 (1993).
3. D. G. Li, N. S. McAlpine, and D. Haneman, Surf. Sci. Lett. 289, L609 (1993).
4. D. G. Li, N. S. McAlpine, and D. Haneman, Surf. Sci. INS 303, 171 (1994).
5. D. G. Li, N. S. McAlpine, and D. Haneman, Appl. Surf. Sci. INS 65/66, 553 (1993).
6. S. C. Langford, D. L. Doering, and J. T. Dickinson, Phys. Rev. Lett. AIP 59, 2795 (1987).
7. D. G. Li, D. Haneman, N. S. McAlpine, and B. Chen, Phys. Rev. Lett. AIP 73, 1170 (1994).
8. H. Yamaguchi and K. Yagi, Surf. Sci. INS 287/288, 820 (1993).
9. H. Yamaguchi and K. Yagi, Surf. Sci. INS 298, 408 (1993).
10. H. Yasunaga and A. Natori, Surf. Sci. Rep. 15, 205 (1992).
11. C. S. Smith, Phys. Rev. 94, 42 (1954).
12. C. J. Kaalund, D. Haneman, and N. S. McAlpine, Surf. Sci. INS 337, L795 (1995).