K*BMDs: A new data structure for verification

Proceedings of European Design and Test Conference

Volumn , Issue , 1996, Pages 2-8

  Drechsler, Rolf ^a   Becker, Bernd ^a   Ruppertz, Stefan ^a  

^a UNIVERSITY OF FREIBURG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

BOOLEAN FUNCTIONS; COMPUTER AIDED DESIGN; DATA STRUCTURES; DECISION THEORY; INTEGRATED CIRCUIT MANUFACTURE; INTEGRATED CIRCUIT TESTING;

BINARY MOMENT DIAGRAM (BMD); KRONECKER MULTIPLICATIVE BMD;

INTEGRATED CIRCUIT LAYOUT;

EID: 0029734405     PISSN: 10661409     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (23)