Optical absorption behaviour of AgSbTe2 thin films

Vacuum

Volumn 47, Issue 1, 1996, Pages 49-51

  Zayed, H A ^a   Ibrahim, A M ^a   Soliman, L I ^a,b  

^a AIN SHAMS UNIVERSITY   (Egypt)

^b NATIONAL RESEARCH CENTRE   (Egypt)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; CRYSTAL STRUCTURE; DATA REDUCTION; ELECTRIC LOSSES; ENERGY GAP; EVAPORATION; FILM PREPARATION; LIGHT ABSORPTION; PERMITTIVITY; REFRACTIVE INDEX; SEMICONDUCTING SILVER COMPOUNDS; THERMAL EFFECTS;

ABSORPTION COEFFICIENT; DIELECTRIC LOSS; OPTICAL ENERGY GAP; RELATIVE PERMITTIVITY; THERMAL EVAPORATION; WAVELENGTH; X RAY DIFFRACTION PATTERN;

THIN FILMS;

EID: 0029734372     PISSN: 0042207X     EISSN: None     Source Type: Journal    
DOI: 10.1016/0042-207X(95)00184-0     Document Type: Article

References (10)

1. S A Aliev and S S Ragimov, Inorg Mater (USA) 28, 2, 239 (1992).
2. T Iric, T Takahama and T Ono, Jpn J Appl Phys, 2, 72 (1963).
3. F F Bookings, J Phys Chem Solids, 10, 341 (1959).
4. P Astakhov, A B Ivonova, M A Markman and L M Simonovski, Inorg Mater, 10, 1492 (1974).
5. R M Marin, L Fedj Allah, G Brun and J C Tedenac, Mater Res Bull, 30, 107 (1985).
6. R A Burmeister and D A Stevenson, J Appl Phys, 34, 1833 (1963).
7. D Lakshminarayana, Thin Solid Films, 201, 91 (1991).
8. G Pinsker and R M Imamov, Sov Phys Crystallogr, 9, 465 (1965).
9. J I Pankove, Optical Processes in Semiconductors, p103. Dover Publications, New York (1971).
10. S Geller and J H Wernick, Acta Crystallogr, 12, 46 (1959).