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Volumn 407, Issue , 1996, Pages 325-330
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Structure of silane films and their adhesion properties
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Author keywords
[No Author keywords available]
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Indexed keywords
ADHESION;
ATOMIC FORCE MICROSCOPY;
CONTACT ANGLE;
FILMS;
FRACTALS;
GLASS;
SCANNING ELECTRON MICROSCOPY;
STABILITY;
STRUCTURE (COMPOSITION);
SURFACES;
THICKNESS MEASUREMENT;
X RAY PHOTOELECTRON SPECTROSCOPY;
ADHESION TESTING;
BACKSCATTERING SECONDARY ELECTRON DETECTOR;
OCTADECYL TRICHLOROSILANE FILMS;
SURFACE COVERAGE;
SILANES;
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EID: 0029733953
PISSN: 02729172
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (2)
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References (10)
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