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Volumn 207-209, Issue PART 1, 1996, Pages 109-112
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Interface diffusion under an electric field. Interface evolution
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Author keywords
Electromigration; Interface Diffusion; Interface Instability
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Indexed keywords
APPROXIMATION THEORY;
BAND STRUCTURE;
DIFFUSION IN SOLIDS;
ELECTRIC FIELD EFFECTS;
ELECTRIC FIELDS;
ELECTROMIGRATION;
GRAIN BOUNDARIES;
PERTURBATION TECHNIQUES;
RESIDUAL STRESSES;
STABILITY;
STRESS CONCENTRATION;
ATOMIC CHARGES;
INTERFACE DIFFUSION;
INTERFACE DIFFUSIONAL FLUX;
INTERFACE INSTABILITY;
INTERFACIAL CURVATURE;
KIRKENDALL EFFECT;
INTERFACES (MATERIALS);
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EID: 0029733421
PISSN: 02555476
EISSN: 16629752
Source Type: Book Series
DOI: 10.4028/www.scientific.net/msf.207-209.109 Document Type: Article |
Times cited : (7)
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References (7)
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