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Volumn 207-209, Issue PART 1, 1996, Pages 109-112

Interface diffusion under an electric field. Interface evolution

Author keywords

Electromigration; Interface Diffusion; Interface Instability

Indexed keywords

APPROXIMATION THEORY; BAND STRUCTURE; DIFFUSION IN SOLIDS; ELECTRIC FIELD EFFECTS; ELECTRIC FIELDS; ELECTROMIGRATION; GRAIN BOUNDARIES; PERTURBATION TECHNIQUES; RESIDUAL STRESSES; STABILITY; STRESS CONCENTRATION;

EID: 0029733421     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/msf.207-209.109     Document Type: Article
Times cited : (7)

References (7)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.