Recording performance & process tolerance of dual-stripe MR heads

IEEE Transactions on Magnetics

Volumn 32, Issue 1, 1996, Pages 31-37

  Guo, Yimin ^a   Hsu, Yimin ^a   Ju, Kochan ^a  

^a Headway Technologies Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

MAGNETIC RECORDING; MAGNETORESISTANCE; MATHEMATICAL MODELS;

DUAL STRIPE MAGNETORESISTIVE HEADS; OFF TRACK ALIGNMENT; PROCESS TOLERANCE;

MAGNETIC HEADS;

EID: 0029733185     PISSN: 00189464     EISSN: None     Source Type: Journal    
DOI: 10.1109/20.477546     Document Type: Article

References (10)

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10. Y. Guo, et al. to be published