Damage to YBa2Cu3Oy surface caused Ar ion beam etching

Japanese Journal of Applied Physics, Part 2: Letters

Volumn 35, Issue 1 B, 1996, Pages

  Matsui, Toshiyuki ^a   Yamaguchi, Dabide ^a   Kamijo, Hiroshi ^a  

^a Euji Electric Corporate Research and   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL ORIENTATION; CURRENT VOLTAGE CHARACTERISTICS; ELECTRON TRANSPORT PROPERTIES; ETCHING; GOLD; INTERFACES (MATERIALS); ION BEAMS; OXIDE SUPERCONDUCTORS; SURFACES; YTTRIUM COMPOUNDS;

ARGON ION BEAM ETCHING; POOLE-FRENKEL EMISSION; SURFACE DAMAGE; YTTRIUM BARIUM COPPER OXIDE;

HIGH TEMPERATURE SUPERCONDUCTORS;

EID: 0029733123     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.35.l97     Document Type: Article

References (17)