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Volumn 30, Issue 1-4, 1996, Pages 53-56
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Electron beam lithography over topography
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Author keywords
[No Author keywords available]
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Indexed keywords
METALLIZING;
PHOTORESISTS;
POLYMETHYL METHACRYLATES;
SCANNING ELECTRON MICROSCOPY;
SILICON WAFERS;
SUBSTRATES;
SURFACES;
ELECTRON BEAM IMAGING;
PLANARIZATION;
SPIN COATING;
TOPOGRAPHY;
VOLTAGE;
ELECTRON BEAM LITHOGRAPHY;
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EID: 0029732779
PISSN: 01679317
EISSN: None
Source Type: Journal
DOI: 10.1016/0167-9317(95)00193-X Document Type: Article |
Times cited : (5)
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References (5)
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