SCOPUS 정보 검색 플랫폼

Microelectronic Engineering

Volumn 30, Issue 1-4, 1996, Pages 451-454

Ultrasmall Pt clusters for single electron tunneling studies

(5) Kreupl, F b Vancea, J b Risch, L a Hofmann, F a Hoffmann, H b

a SIEMENS AG (Germany)

b UNIVERSITY OF REGENSBURG (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM; CAPACITANCE; CRYSTAL STRUCTURE; ELECTRIC INSULATING MATERIALS; ELECTRIC RESISTANCE; ELECTRON DEVICES; OXIDATION; PLATINUM; SCANNING TUNNELING MICROSCOPY; SUBSTRATES; TEMPERATURE; TUNNEL JUNCTIONS;

COULOMB BLOCKADE; ELECTRON BEAM EVAPORATOR; INTERFACIAL RESISTANCE; ULTRASMALL PLATINUM CLUSTERS;

ELECTRON TUNNELING;

EID: 0029732688 PISSN: 01679317 EISSN: None Source Type: Journal
DOI: 10.1016/0167-9317(95)00285-5 Document Type: Article

Times cited : (6)

References (8)

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2
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3
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4
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5
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