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Volumn 30, Issue 1-4, 1996, Pages 137-140
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Fabrication of waveguide tapers by semitransparent mask photolithography
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Author keywords
[No Author keywords available]
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Indexed keywords
ELECTRON BEAM LITHOGRAPHY;
ELECTRON BEAMS;
INTEGRATED OPTOELECTRONICS;
MASKS;
MICROELECTRONIC PROCESSING;
PHOTORESISTS;
SURFACE ROUGHNESS;
WAVEGUIDES;
FIBER CHIP COUPLING LOSSES;
FRESNEL CORRECTION;
LATERAL ALIGNMENT TOLERANCES;
MASK TRANSMITTANCE;
SEMITRANSPARENT MASK PHOTOLITHOGRAPHY;
WAVEGUIDE TAPERS;
PHOTOLITHOGRAPHY;
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EID: 0029732127
PISSN: 01679317
EISSN: None
Source Type: Journal
DOI: 10.1016/0167-9317(95)00212-X Document Type: Article |
Times cited : (2)
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References (3)
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