Short-range disorder of Si and Ti in the tetrahedral double-chain unit of synthetic Ti-bearing potassium-richterite

American Mineralogist

Volumn 81, Issue 1-2, 1996, Pages 56-60

  Della Ventura, Giancarlo ^a   Robert, Jean Louis ^b   Hawthorne, Frank C ^c   Prost, René ^d  

^a ROMA TRE UNIVERSITY   (Italy)

^b CNRS   (France)

^c UNIVERSITY OF MANITOBA   (Canada)

^d CEMAGREF   (France)

Author keywords

[No Author keywords available]

Indexed keywords

FACINGS; FOURIER TRANSFORM INFRARED SPECTROSCOPY; POTASSIUM; RIETVELD REFINEMENT; SILICON; SILICON COMPOUNDS; TITANIUM; TITANIUM METALLOGRAPHY;

BAND INTENSITY; DOUBLE CHAIN; ENDMEMBERS; GAUSSIAN MODEL; INFRARED SPECTRUM; OVERLAPPING COMPONENTS; RIETVELD STRUCTURE REFINEMENT; SINGLE BAND;

TITANIUM COMPOUNDS;

FTIR; RICHTERITE; RIETVELD REFINEMENT; SHORT RANGE DISORDER; SILICON; TITANIUM;

EID: 0029731335     PISSN: 0003004X     EISSN: None     Source Type: Journal    
DOI: 10.2138/am-1996-1-208     Document Type: Article

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