Reliability analysis of a powerloom plant with cold standby for its strategic unit

Microelectronics Reliability

Volumn 36, Issue 1, 1996, Pages 115-119

  Pandey, D ^a   Jacob, Mendus ^a   Yadav, Jyotsna ^a  

^a CH CHARAN SINGH UNIVERSITY   (India)

Author keywords

[No Author keywords available]

Indexed keywords

ERROR ANALYSIS; FAILURE ANALYSIS; INDUSTRIAL PLANTS; PROBABILITY DENSITY FUNCTION; QUALITY CONTROL; REDUNDANCY; VARIATIONAL TECHNIQUES;

COLD STANDBY; COMMON CAUSE FAILURE; CRITICAL HUMAN ERROR; MEAN TIME TO FAILURE; OVERESTIMATION; PARALLEL REDUNDANCY; POWERLOOM PLANTS; STEADY STATE AVAILABILITIES;

RELIABILITY THEORY;

EID: 0029728862     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/0026-2714(95)00013-R     Document Type: Article

References (3)

1. W. K. Chung, Reliability analysis of a k-out-of-N:G parallel redundant system with multiple critical errors, Microelectron. Reliab. 30, 585-589 (1990).
2. B. S. Dhillon, Stochastic modelling of k-out-of-n units family of systems, Int. J. syst. Sci. 23, 1277-1287 (1992).
3. B. S. Dhillon and C. Singh, Engineering Reliability; New Techniques and Applications. John Wiley, New York (1981).