Evaluation of metal-Bi2Te3 contacts by electron tunneling spectroscopy

International Conference on Thermoelectrics, ICT, Proceedings

Volumn , Issue , 1996, Pages 404-407

  Nagao, Jiro ^a   Hatta, Eiji ^a   Mukasa, Koichi ^a  

^a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT VOLTAGE CHARACTERISTICS; ELECTRON TUNNELING; ENERGY GAP; OHMIC CONTACTS; SCHOTTKY BARRIER DIODES; SINGLE CRYSTALS; THERMAL CONDUCTIVITY OF SOLIDS; THERMOELECTRICITY;

BRIDGMAN METHOD; ELECTRON TUNNELING SPECTROSCOPY; METAL SEMICONDUCTOR SCHOTTKY JUNCTIONS; TUNNEL CONDUCTANCE;

SEMICONDUCTOR METAL BOUNDARIES;

EID: 0029728741     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (14)