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Volumn 398, Issue , 1996, Pages 619-624
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Study of the effect of oxide structure on the synthesis of nanocrystalline Ge from Si1-xGexO2
a a a a |
Author keywords
[No Author keywords available]
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Indexed keywords
ANNEALING;
ATOMIC FORCE MICROSCOPY;
CRYSTAL GROWTH;
FOURIER TRANSFORM INFRARED SPECTROSCOPY;
NANOSTRUCTURED MATERIALS;
OXIDATION;
PARTICLE SIZE ANALYSIS;
PRECIPITATION (CHEMICAL);
RAMAN SPECTROSCOPY;
SCANNING ELECTRON MICROSCOPY;
SILICON ALLOYS;
X RAY PHOTOELECTRON SPECTROSCOPY;
CRYSTALLITES;
HYDROTHERMAL OXIDATION;
OXIDE THICKNESS;
GERMANIUM;
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EID: 0029728711
PISSN: 02729172
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (3)
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References (9)
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