Crystal growth of narrow gap semiconductors for thermoelectric applications

International Conference on Thermoelectrics, ICT, Proceedings

Volumn , Issue , 1996, Pages 155-158

  Kloc, Ch ^a   Fess, K ^a   Kaefer, W ^a   Friemelt, K ^a   Riazi Nejad, H ^a   Wendl, M ^a   Bucher, E ^a  

^a UNIVERSITY OF KONSTANZ   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

COOLING SYSTEMS; CRYSTAL DEFECTS; CRYSTAL GROWTH FROM MELT; ELECTRIC VARIABLES MEASUREMENT; ELECTRON TRANSPORT PROPERTIES; SEMICONDUCTOR GROWTH; SINGLE CRYSTALS; THERMOELECTRICITY; VAPORS;

BRIDGMAN TECHNIQUES; CZOCHRALSKI TECHNIQUES; NARROW GAP SEMICONDUCTORS; THERMOELECTRIC APPLICATIONS; VAPOR TRANSPORT;

SEMICONDUCTOR MATERIALS;

EID: 0029728602     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (9)