Encapsulation and diagnosis with fault dictionaries

AUTOTESTCON (Proceedings)

Volumn , Issue , 1996, Pages 441-446

  Simpson, William R ^a   Sheppard, John W ^a  

^a INSTITUTE FOR DEFENSE ANALYSES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; AUTOMATIC TESTING; COMPUTER AIDED NETWORK ANALYSIS; COMPUTER ARCHITECTURE; DIGITAL CIRCUITS; ELECTRIC FAULT LOCATION; INTEGRATED CIRCUIT TESTING; LOGIC CIRCUITS; VECTORS;

DIGITAL CIRCUIT DIAGNOSIS; FAULT DICTIONARIES;

ELECTRONIC EQUIPMENT TESTING;

EID: 0029728315     PISSN: 07347510     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (17)