Optical characterization of ITO films used in flat panel displays

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 2725, Issue , 1996, Pages 471-477

  Forouhi, A Rahim ^a   Li, G G ^a   Bloomer, Iris ^a  

^a n & k Technology Inc Santa   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ENERGY BANDGAPS; INDIUM TIN OXIDE;

CHARACTERIZATION; ETCHING; INDIUM COMPOUNDS; INFRARED RADIATION; OPTICAL PROPERTIES; QUARTZ; REFRACTIVE INDEX; SEMICONDUCTING SILICON; THICKNESS MEASUREMENT; ULTRAVIOLET RADIATION;

DISPLAY DEVICES;

EID: 0029727395     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (3)