Electron microscopy and microanalysis of ceramics

Journal of the European Ceramic Society

Volumn 16, Issue 3, 1996, Pages 323-338

  Thomas, Gareth ^a,b  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CERAMIC MATERIALS; DEFECTS; GRAIN BOUNDARIES; HETEROJUNCTIONS; MAGNETIC MATERIALS; MAGNETOOPTICAL DEVICES; MICROANALYSIS; MICROSTRUCTURE; MIRRORS; MULTILAYERS; REVIEWS;

COBALT OXIDES; CONVERGENT BEAM METHOD; GARNET TYPE COMPOUND; MAGNETIC STRUCTURE; NICKEL OXIDES; SILICON NITRIDES;

TRANSMISSION ELECTRON MICROSCOPY;

EID: 0029727064     PISSN: 09552219     EISSN: None     Source Type: Journal    
DOI: 10.1016/0955-2219(95)00113-1     Document Type: Article

References (49)

1. Thomas, G., Electron Microscopy and materials science. Acta Microscop., 1 (1) (1992) 1-19.
2. Spence, J. C. H., Experimental High Resolution Electron Microscopy, 2nd ed., Oxford University Press, UK, 1988.
3. Epicier, T., O'Keefe, M. A. & Thomas, G., Atomic imaging of 3:2 mullite. Acta Cryst., A46 (1990) 948-62.
4. See, for example, the annual proceedings of the Microscopy Society of America, and the proceedings of the International and Regional Electron Microscopy Congresses held every four years.
5. For example, M. O'Keefe, National Center for Electron Microscopy, Lawrence Berkeley Laboratory, Berkeley, California 94720, USA.
6. Steeds, J. W., Convergent beam electron diffraction. In Introduction to Analytical Electron Microscopy, eds J. J. Hren, T. J. Goldstein & D. C. Joy, Plenum, New York, 1979, pp. 387-422.
7. Dass, M. L. A., Bielicki, T. A. & Thomas, G., Convergent beam studies on lead zirconate titanate ceramics. In Proceedings of the Electron Microscopy Society of America, ed. G. W. Bailey. San Francisco Press, 1986, pp. 482-3.
8. Callahan, D. L. & Thomas, G., Convergent beam diffraction analysis of lattice shifts in AlN. J. Am. Ceram. Soc., 75 (5) (1992) 1092-6.
9. Thomas, G. & Goringe, M. J., Transmission Electron Microscopy of Materials, J. Wiley & Sons, New York, and Tech Books, Fairfax, VA, 1981.
10. Merk, N. & Thomas, G., Structure and composition of submicroscopic mullite whiskers. J. Mat. Res., 6 (4) (1991) 825-34.
11. 5. In Proceedings of the Electron Microscopy Society of America, ed. G. W. Bailey. San Francisco Press, 1989, pp. 422-3.
12. Van Tendeloo, G., Faker, K. T. & Thomas, G., Characterization of long period polytypoids in AlN ceramics. J. Mat. Sci., 18 (1983) 525-7.
13. 3-AIN System. In Mat. Res. Soc. Symp. Proc., 60 1986, pp. 211-20.
14. 2 systems. J. Sol. State Chem., 33 (1) (1980) 63-82.
15. Ramesh, R., Green, S. M. & Thomas, G., Microstructure property relationships in ceramic superconductors. In Studies of High Temperature Superconductors, Vol. 5, ed. Anant Narlikar. New York, Nova Science Publishers (4) 1989, pp. 361-403.
16. McFayden, André, Mullite-whisker reinforced molybdenum disilicide composites. PhD thesis. University of California, Berkeley, CA, 1995.
17. Vasudevan, A. K. & Petrovic, J. J., A comparative overview of molybdenum disilicide composites. Mater. Sci. Eng., A155 (1992) 1-17.
18. Lessing, P. A., Gordon, R. S. & Mazdiyasni, K. S., Creep of polycrystalline mullite. J. Am. Ceram. Soc., 58 (1975) 149.
19. Williams, D. B., Practical Analytical Electron Microscopy in Materials Science, Verlag Chemie Int., 1984.
20. Blake, D. F. et al. Nature and origin of interstellar diamond. Nature, 332 (1988) 611-13.
21. Proceedings of Symposium on Magnetic Imaging, Microscopy Society of American, eds G. W. Bailey & C. L. Rider, San Francisco Press, 1993, pp. 1010-53.
22. Lin, I-Nan, Mishra, R. K. & Thomas, G., TEM study of structure and composition of MnZn ferrites. In Proceedings of Advanced Materials Characterization, Plenum, New York, 1983, pp. 351-8.
23. Thomas, G., High resolution analyses and interfacial design of inorganic materials. Scripta Metall Mater., 31 (1994) 953-8.
24. 3 fluxed hot pressed silicon nitride. J. Am. Ceram. Soc., 61 (1978) 114-18.
25. Thomas, G., Grain boundaries and interfaces. In Ceramic Microstructures '86, eds J. A. Pask & A. G. Evans. Plenum, New York, 1988, pp. 55-72.
26. Thomas, G., Ahn, C. & Weiss, J., Characterization and crystallization of Y-Si-Al-O-N glasses. J. Am. Ceram. Soc., 65 (1982) C185-8.
27. 2-AlN system. J. Am. Ceram. Soc., 71 (1988) 236-44.
28. 4 ceramics. J. Am. Ceram. Soc., 75 (1992) 2037-43.
29. 4 ceramics. J. Am. Ceram. Soc., 58 (1975) 323-6.
30. 3 pseudoternary system. J. Am. Ceram. Soc., 60 (1977) 249.
31. Loehman, R. E., Preparation and properties of oxynitride glasses. J. Non-Cryst. Solids, 56 (1983) 411-16.
32. 4 by a post-fabrication heat treatment. J. Am. Ceram. Soc., 65 (1982) C51-2.
33. Bonnell, D. A., Tien, T.-Y. & Rühle, M., Controlled crystallization of the amorphous phase in silicon nitride ceramics. J. Am. Ceram. Soc., 70 (1987) 460-5.
34. 4 sintered with YAlSiON glass. J. Am. Ceram. Soc., 73 (1990) 1606-14.
35. 4 with RE oxide additions. J. Am. Ceram. Soc., 64 (1985) 304-9.
36. 7O. Mat. Sci. Eng., 71 (1985) 87-94.
37. 4 at elevated temperatures. J. Am. Ceram. Soc., 66 (1983) 884-9.
38. 4 ceramics. J. Am. Ceram. Soc., 75 (1992) 2050-5.
39. 4 ceramics. J. Am. Ceram. Soc., 75 (1992) 2044-9.
40. 4 ceramics sintered with RE oxides. Acta Metall. Mater., 43 (1995) 923-30.
41. 4 ceramics sintered with RE oxides. Acta Metall. Mater., 42 (1994) 3055-64.
42. Kleebe, H.-J., Cinibulk, M. K., Cannon, R. M. & Rühle, M., Statistical analysis of the intergranular film thickness in silicon nitride ceramics. J. Am. Ceram. Soc., 76 (1993) 1969-77.
43. Hall, C. W., Magneto-optic media. In Storage and Recording Systems, Conference Publication 402. London, Institute of Electrical Engineers, 1994, pp. 137-9.
44. Lin, C. J., Co/Pt multilayers for magneto-optical recording. In High Density Recording, ed. K. H. J. Buschow, NATO ASI Series, 1993, pp. 461-81.
45. 12 heterostructures grown by pulsed laser deposition. In Epitaxial Oxide Thin Films and Heterostructures, eds D. K. Fork, J. M. Phillips, R. Ramesh & R. M. Wolf, Pittsburgh, Mat. Res. Soc., 1994, pp. 65-72.
46. Hütten, A., Cao, W., Walton, C. & Thomas, G., Structural properties of multilayer thin films. In Proceedings of 13th Congress on Electron Microscopy, 2A, Paris, French Society for Electron Microscopy, 1994, pp. 231-2.
47. 3 using TEM. Scripta Metall. Mater., 25 (1991) 2633-8.
48. Carey, M. J., Spada, F. E., Berkowitz, A. E., Cao, W. & Thomas, G., Preparation and structural characterization of sputtered CoO/NiO thin epitaxial films. J. Mat. Res., 6 (1991) 2680-7.
49. Fullerton, E. E., Cao, W., Thomas, G., Schuller, I. K., Carey, M. J. & Berkowitz, A. E., Quantitative characterization of epitaxial superlattices by X-ray diffraction and HREM. Appl. Phys. Let., 63 (1993) 482-8.