Structure and morphology of nanosized lead inclusions in aluminum grain boundaries

Interface Science

Volumn 3, Issue 4, 1996, Pages 279-288

  Johnson, E ^a   Johansen, A ^a   Hinderberger, S ^a   Xiao, S Q ^a   Dahmen, U ^a  

^a UNIVERSITY OF COPENHAGEN   (Denmark)

Author keywords

[No Author keywords available]

Indexed keywords

GRAIN BOUNDARIES; INTERFACES (MATERIALS); LEAD; MICROSTRUCTURE; MORPHOLOGY; TRANSMISSION ELECTRON MICROSCOPY;

MAZED BICRYSTAL FILMS; MODIFIED WULFF CONSTRUCTION; NANOSIZED INCLUSIONS; PARALLEL TOPOTAXY;

ALUMINUM;

EID: 0029727001     PISSN: 09277056     EISSN: None     Source Type: Journal    
DOI: 10.1007/BF00194706     Document Type: Article

References (25)