Determination of bulk mismatch values in heterostructures by TEM/CBED

Materials Research Society Symposium - Proceedings

Volumn 405, Issue , 1996, Pages 467-472

  Armigliato, A ^a   Balboni, R ^a   Frabboni, S ^a  

^a CNR   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL ORIENTATION; ELECTRON BEAMS; ELECTRON DIFFRACTION; LATTICE CONSTANTS; SEMICONDUCTING SILICON COMPOUNDS; TRANSMISSION ELECTRON MICROSCOPY;

BULK MISMATCH VALUES; CONVERGENT BEAM ELECTRON DIFFRACTION (CBED) PATTERNS; HIGH ORDER LAUE ZONE LINES; ISOTROPIC ELASTICITY THEORY;

HETEROJUNCTIONS;

EID: 0029726997     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (12)