Schottky barrier heights of Ni, Pt, Pd, and Au on n-type GaN

Materials Research Society Symposium - Proceedings

Volumn 395, Issue , 1996, Pages 831-835

  Schmitz, A C ^a   Ping, A T ^a   Asif Khan, M ^a   Adesida, I ^a  

^a UNIVERSITY OF ILLINOIS AT URBANA CHAMPAIGN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE MEASUREMENT; CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC CURRENT MEASUREMENT; GOLD; NICKEL; PALLADIUM; PLATINUM; SEMICONDUCTING GALLIUM COMPOUNDS; VOLTAGE MEASUREMENT;

CAPACITANCE VOLTAGE TECHNIQUE; GALLIUM NITRIDE; SCHOTTKY BARRIER HEIGHTS;

SCHOTTKY BARRIER DIODES;

EID: 0029726756     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (5)