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Volumn 395, Issue , 1996, Pages 343-348
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Low temperature growth of oriented gallium nitride using pulsed laser deposition
a a a a |
Author keywords
[No Author keywords available]
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
DEPOSITION;
FILM GROWTH;
LOW TEMPERATURE EFFECTS;
MORPHOLOGY;
NITRIDES;
OPTICAL MICROSCOPY;
PRESSURE EFFECTS;
PULSED LASER APPLICATIONS;
SEMICONDUCTING GALLIUM COMPOUNDS;
X RAY DIFFRACTION;
X RAY PHOTOELECTRON SPECTROSCOPY;
AMBIENT PRESSURE;
FILM MORPHOLOGY;
GALLIUM NITRIDE;
LOW TEMPERATURE GROWTH;
PULSED LASER DEPOSITION;
ROCKING CURVE;
TARGET MATERIAL;
SEMICONDUCTOR GROWTH;
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EID: 0029726429
PISSN: 02729172
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (1)
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References (15)
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