Raman spectroscopy study of pulsed laser induced structural transformations in amorphous Ge films

Materials Research Society Symposium - Proceedings

Volumn 397, Issue , 1996, Pages 435-440

  Garcia, C ^a   Prieto, A C ^a   Jimenez, J ^a   Siegel, J ^a   Solis, J ^a   Afonso, C N ^a   Chafai, M ^a  

^a UNIVERSITY OF VALLADOLID   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALLIZATION; ESTIMATION; GERMANIUM; GLASS; LASER PULSES; MATHEMATICAL MODELS; PHASE TRANSITIONS; RAMAN SPECTROSCOPY; RELAXATION PROCESSES; SEMICONDUCTING SILICON; SUBSTRATES; THERMAL CONDUCTIVITY;

AVERAGE BOND ANGLE DISTORTION; CORRELATION LENGTH MODEL; PULSE FLUENCE; STRUCTURAL TRANSFORMATIONS;

AMORPHOUS FILMS;

EID: 0029726395     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (13)