Direct measurement for SOI and bulk diodes of single-event-upset charge collection from energetic ions and alpha particles

Digest of Technical Papers - Symposium on VLSI Technology

Volumn , Issue , 1996, Pages 98-99

  Aton, Tom ^a   Seitchik, Jerold ^a   Joyner, Keith ^a   Houston, Ted ^a   Shichijo, Hisashi ^a  

^a TEXAS INSTRUMENTS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALPHA PARTICLES; CHARGE CARRIERS; FLUORINE; INTEGRATED CIRCUITS; IONS; RANDOM ACCESS STORAGE; SEMICONDUCTING FILMS; SEMICONDUCTING SILICON; SEMICONDUCTOR DEVICE STRUCTURES; SILICON ON INSULATOR TECHNOLOGY;

BULK DIODES; DIRECT MEASUREMENT; DYNAMIC RANDOM ACCESS STORAGE; ENERGETIC IONS; FLUORINE ION STRIKES; SILICON ON INSULATOR DIODES; SINGLE EVENT UPSET CHARGE COLLECTION;

SEMICONDUCTOR DIODES;

EID: 0029725242     PISSN: 07431562     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (5)