메뉴 건너뛰기





Volumn , Issue , 1996, Pages 22-23

Hot-carrier effect in ultra-thin-film (UTF) fully-depleted SOI MOSFET's

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL DEFECTS; DEGRADATION; ELECTRIC CURRENTS; GATES (TRANSISTOR); HOT CARRIERS; INTERFACES (MATERIALS); ION IMPLANTATION; OXIDES; SILICON ON INSULATOR TECHNOLOGY; SILICON WAFERS; THIN FILM DEVICES; ULTRATHIN FILMS;

EID: 0029725136     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (5)

References (5)
  • Reference 정보가 존재하지 않습니다.

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.