Use of in-situ dielectric sensing for intelligent processing and health monitoring

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 2779, Issue , 1996, Pages 112-117

  Kranbuehl, D ^a   Aandahl, H ^a   Haralampus, N ^a   Newby, W ^a   Hood, David ^a   Boiteux, G ^a   Seytre, G ^a   Pascault, Jean P ^a   Maazouz, A ^a   Gerard, J F ^a   Sautereau, H ^a   Chailan, J F ^a   Loos, A C ^a   MacRae, J D ^a  

^a Dept of Economics and Thomas Jefferson Program in Public Policy at the College of William and Mary   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AUTOMATION; CALIBRATION; DESIGN; DIELECTRIC PROPERTIES; INTELLIGENT STRUCTURES; MONITORING; NONDESTRUCTIVE EXAMINATION; POLYMERS; REMOTE SENSING; SERVICE LIFE;

FREQUENCY DEPENDENCE; IN-SITU DIELECTRIC SENSING; INTELLIGENT PROCESSING;

OPTICAL SENSORS;

EID: 0029724676     PISSN: 0277786X     EISSN: None     Source Type: None    
DOI: 10.1117/12.237095     Document Type: Conference Paper

References (7)