Degradation monitor for the light output of LEDs based on cathodoluminescence signals and junction ideality factor

Annual Proceedings - Reliability Physics (Symposium)

Volumn , Issue , 1996, Pages 188-194

  Wittpahl, V ^a   Liu, Y Y ^a   Chan, D S H ^a   Chim, W K ^a   Phang, J C H ^a   Balk, L J ^a   Yan, K P ^a  

^a NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

Author keywords

[No Author keywords available]

Indexed keywords

CATHODOLUMINESCENCE; DEGRADATION; MONITORING; SEMICONDUCTOR JUNCTIONS;

DEGRADATION MONITOR; DIFFERENTIAL CATHODOLUMINESCENCE SIGNAL OUTPUT; JUNCTION IDEALITY FACTOR;

LIGHT EMITTING DIODES;

EID: 0029724275     PISSN: 00999512     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (0)