PLZT-based multilayer composite thin films, Part I: Experimental investigation of composite film structures

Ferroelectrics

Volumn 177, Issue 3-4, 1996, Pages 221-236

  Dausch, D E ^a,b   Furman, E ^a   Wang, F ^a,c   Haertling, G H ^a  

^a CLEMSON UNIVERSITY   (United States)

^b NASA LANGLEY RESEARCH CENTER   (United States)

^c NZ Applied Technologies   (United States)

Author keywords

Antiferroelectrics; Electrical properties; Ferroelectrics; Multilayer composites; Relaxors; Thin films

Indexed keywords

ANNEALING; COERCIVE FORCE; COMPOSITE MATERIALS; COMPOSITION; CRYSTAL STRUCTURE; ELECTRIC PROPERTIES; FERROELECTRIC MATERIALS; LEAD COMPOUNDS; MULTILAYERS; POLARIZATION;

ANTIFERROELECTRICS; AUTOMATIC SPIN; COMPOSITE FILM STRUCTURES; DIP COATING; DOMAIN SWITCHING; HYSTERESIS LOOP SQUARENESS; LEAD LANTHANUM ZIRCONIUM TITANATE; MULTILAYER COMPOSITES; POLARIZATION REMANENCE; RELAXORS;

THIN FILMS;

EID: 0029724170     PISSN: 00150193     EISSN: None     Source Type: Journal    
DOI: 10.1080/00150199608223631     Document Type: Article

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