SCOPUS 정보 검색 플랫폼

Solid-State Electronics

Volumn 40, Issue 1-8, 1996, Pages 725-728

Direct measurement of exciton diffusion in quantum wells

(4) Heller, W a Filoramo, A b Roussignol, Ph b Bockelmann, U a

a WALTER SCHOTTKY INSTITUT (Germany)

b ECOLE NORMALE SUPÉRIEURE (France)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE CARRIERS; DISLOCATIONS (CRYSTALS); EMISSION SPECTROSCOPY; EXCITONS; MATHEMATICAL MODELS; PHOTOLUMINESCENCE; SEMICONDUCTING GALLIUM ARSENIDE; SEMICONDUCTOR QUANTUM WELLS;

DIFFUSION CONSTANT; DISPLACEMENT; IN PLANE DIFFUSION MODEL;

DIFFUSION IN SOLIDS;

EID: 0029723099 PISSN: 00381101 EISSN: None Source Type: Journal
DOI: 10.1016/0038-1101(95)00351-7 Document Type: Article

Times cited : (30)

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