Parametric modelling of linear time invariant S-parameter devices in the Laplace domain

Conference Record - IEEE Instrumentation and Measurement Technology Conference

Volumn 2, Issue , 1996, Pages 1244-1249

  Rolain, Y ^a   Vandersteen, G ^a   Schreurs, Dominique ^a   Van den Bosch, Sven ^a  

^a VRIJE UNIVERSITEIT BRUSSEL   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC VARIABLES MEASUREMENT; HIGH ELECTRON MOBILITY TRANSISTORS; LAPLACE TRANSFORMS; MATRIX ALGEBRA; STATISTICAL METHODS; TRANSFER FUNCTIONS;

LINEAR TIME INVARIANT SYSTEMS; MAXIMUM LIKELIHOOD ESTIMATOR; SCATTERING PARAMETERS; WAFER PROBING STATION; WHITE BOX MODELS;

SEMICONDUCTOR DEVICE MODELS;

EID: 0029722369     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (7)