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Volumn , Issue , 1996, Pages 180-187
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Electromigration design rules for bidirectional current
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Author keywords
[No Author keywords available]
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Indexed keywords
ELECTRIC CONTACTS;
ELECTRIC WIRING;
ELECTROMIGRATION;
LEAKAGE CURRENTS;
MATHEMATICAL MODELS;
METALLIZING;
STRESSES;
BIDIRECTIONAL CURRENT;
DAMAGE HEALING MODEL;
ELECTROMIGRATION DESIGN RULES;
INTEGRATED CIRCUIT LAYOUT;
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EID: 0029721909
PISSN: 00999512
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (13)
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References (15)
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