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Volumn , Issue , 1996, Pages 84-92

New physics-based model for time-dependent-dielectric-breakdown

Author keywords

[No Author keywords available]

Indexed keywords

DEFECTS; ELECTRIC BREAKDOWN; MATHEMATICAL MODELS; RELIABILITY; STRESSES;

EID: 0029721805     PISSN: 00999512     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (20)

References (23)
  • Reference 정보가 존재하지 않습니다.

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.