New physics-based model for time-dependent-dielectric-breakdown

Annual Proceedings - Reliability Physics (Symposium)

Volumn , Issue , 1996, Pages 84-92

  Schlund, Barry ^a   Suehle, John S ^a   Messic, Cleston ^a   Chaparala, Prasad ^a  

^a MOTOROLA INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DEFECTS; ELECTRIC BREAKDOWN; MATHEMATICAL MODELS; RELIABILITY; STRESSES;

TIME DEPENDENT DIELECTRIC BREAKDOWN;

OXIDES;

EID: 0029721805     PISSN: 00999512     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (23)