Fast regularization technique for expectation maximization algorithm for optical sectioning microscopy

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 2655, Issue , 1996, Pages 199-208

  Conchello, Jose Angel ^a   McNally, James G ^a  

^a WASHINGTON UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

MAXIMUM LIKELIHOOD; OPTICAL SECTIONING MICROSCOPY;

ALGORITHMS; COMPUTATIONAL COMPLEXITY; ESTIMATION; MICROSCOPIC EXAMINATION; PROBABILITY;

IMAGE ENHANCEMENT;

EID: 0029721393     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (44)