Effect of low earth orbit atomic oxygen exposure on phenylphosphine oxide-containing poly(arylene ether)s

International SAMPE Symposium and Exhibition (Proceedings)

Volumn 41, Issue 2, 1996, Pages 1747-1759

  Connell, J W ^a   Smith, J G ^a   Kalil, C G ^a   Siochi, E J ^a  

^a NASA LANGLEY RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CHEMICAL ATTACK; GEL PERMEATION CHROMATOGRAPHY; ORGANIC POLYMERS; PHOSPHATES; SURFACES; X RAY PHOTOELECTRON SPECTROSCOPY;

ATOMIC OXYGEN; ATOMIC OXYGEN RESISTANT POLYMERS; POLYARYLENE ETHER PHOSPHINE OXIDE; WEIGHT LOSS DATA;

THIN FILMS;

EID: 0029721026     PISSN: 08910138     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (32)