New complete diagnosis patterns for wiring interconnects

Proceedings - Design Automation Conference

Volumn , Issue , 1996, Pages 203-208

  Park, Sungju ^a  

^a Hanyang University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; COMPUTER AIDED DESIGN; ELECTRIC FAULT CURRENTS;

BOUNDARY SCAN DESIGN TECHNIQUE; INTERCONNECT TEST GENERATION ALGORITHM; MULTIPLE INTERCONNECT FAULTS; WIRING INTERCONNECTS;

INTERCONNECTION NETWORKS;

EID: 0029720906     PISSN: 0738100X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (11)