On-wafer measurement at millimeter wave frequencies

IEEE MTT-S International Microwave Symposium Digest

Volumn 3, Issue , 1996, Pages 1683-1686

  Williams, Dylan F ^a   Belquin, Jean Maxence ^a   Dambrine, Gilles ^a   Fenton, Randy ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CALIBRATION; ELECTRIC FREQUENCY MEASUREMENT; MILLIMETER WAVES;

MILLIMETER WAVE FREQUENCIES; ON WAFER MEASUREMENTS; THRU REFLECT-LINE CALIBRATIONS;

WAVEGUIDES;

EID: 0029720149     PISSN: 0149645X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (5)