Characterization of defects in deuterium-implanted beryllium

Hydrogen Effects in Materials

Volumn , Issue , 1996, Pages 105-114

  Anderl, R A ^a   Denison, A B ^a   Szpala, S ^a   Asoka Kumar, P ^a   Lynn, K G ^a   Nielsen, B ^a  

^a IDAHO NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; BERYLLIUM; DEFECTS; DEUTERIUM; ION IMPLANTATION;

ANNIHILATION RADIATION; POSITRON BEAM DEPTH PROFILE ANALYSES; POSITRON ENERGY;

SURFACE TREATMENT;

EID: 0029719869     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (20)