Fault diagnosis using state information

Proceedings - Annual International Conference on Fault-Tolerant Computing

Volumn , Issue , 1996, Pages 96-103

  Boppana, Vamsi ^a   Hartanto, Ismed ^a   Fuchs, W Kent ^a  

^a UNIVERSITY OF ILLINOIS AT URBANA CHAMPAIGN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; CRITICAL PATH ANALYSIS; DATA REDUCTION; ELECTRIC NETWORK ANALYSIS; INTEGRATED CIRCUIT TESTING; SEQUENTIAL CIRCUITS; STATE ASSIGNMENT; STATE SPACE METHODS;

REPEATED FAULT DIAGNOSIS; STATE INFORMATION;

FAULT TOLERANT COMPUTER SYSTEMS;

EID: 0029719785     PISSN: 07313071     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (20)