메뉴 건너뛰기




Volumn 14, Issue 4-5, 1996, Pages 321-326

Rietveld analysis of high pressure powder diffraction data

Author keywords

High pressure; Neutron diffraction; Nitromethane; Rietveld analysis; X ray diffraction

Indexed keywords

CONTAMINATION; HIGH PRESSURE ENGINEERING; HYDROCARBONS; LIGHT REFLECTION; NEUTRON DIFFRACTION; X RAYS;

EID: 0029719502     PISSN: 08957959     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (6)

References (5)
  • 4
    • 0000947681 scopus 로고
    • R. Engelke, D. Schiferl, C. B. Storm and W. L. Earl, J. Phys. Chem., 92, 6815-6819, (1988). D. T. Cromer, R. R. Ryan and D. Schiferl, J. Phys. Chem., 89, 2315-2318 (1985).
    • (1985) J. Phys. Chem. , vol.89 , pp. 2315-2318
    • Cromer, D.T.1    Ryan, R.R.2    Schiferl, D.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.