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Journal of Magnetism and Magnetic Materials

Volumn 154, Issue 2, 1996, Pages 165-174

X-ray and magnetoresistance measurements of annealed Co/Cu multilayers

(5) Laidler, H b Pape, I a Gregory, C I a Hickey, B J b Tanner, B K a

a DURHAM UNIVERSITY (United Kingdom)

b UNIVERSITY OF LEEDS (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; MAGNETIC PROPERTIES; MAGNETORESISTANCE; MOLECULAR BEAM EPITAXY; SURFACE ROUGHNESS; SYNCHROTRON RADIATION; X RAY ANALYSIS;

MAGNETOTRANSPORT MEASUREMENTS; X RAY SCATTERING;

MAGNETIC MATERIALS;

EID: 0029718428 PISSN: 03048853 EISSN: None Source Type: Journal
DOI: 10.1016/0304-8853(95)00600-1 Document Type: Article

Times cited : (10)

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