Examination of interace roughening in ion irradiated Cu/Nb films by computer simulation and by x-ray diffraction

Materials Research Society Symposium - Proceedings

Volumn 396, Issue , 1996, Pages 107-112

  Partyka, P J ^a   Averback, R S ^a   Robinson, I K ^a   Lee, Y S ^a   Flynn, C P ^a   Bellon, P ^a  

^a UNIVERSITY OF ILLINOIS AT URBANA CHAMPAIGN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; COPPER; INTERFACES (MATERIALS); ION IMPLANTATION; IRRADIATION; KINETIC THEORY; METALLIC FILMS; MONTE CARLO METHODS; NIOBIUM; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SYNCHROTRON RADIATION; X RAY DIFFRACTION;

CRYSTAL TRUNCATION ROD ANALYSIS; IMMISCIBLE SYSTEM; INTERFACE ROUGHENING; ION FLUX; ION IRRADIATION;

SURFACE ROUGHNESS;

EID: 0029717955     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (2)